ALEXANDRIA, Va., July 16 -- United States Patent no. 12,363,234, issued on July 15, was assigned to Canon K.K. (Tokyo).
"Inspection system, inspection apparatus, control method of inspection system, and control method of inspection apparatus for inspecting an image based on an inspection setting" was invented by Erika Azuma (Chiba, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus includes one or more controllers having one or more processors and one or more memories, the one or more controllers configured to function as a receiving unit configured to receive an image to be registered as a reference image, a reception unit configured to receive an inspection setting for the receive...