US Patent Issued to Canon on July 1 for "Item inspection system, inspection method, and information processing apparatus" (Japanese Inventors)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,346,764, issued on July 1, was assigned to Canon K.K. (Tokyo).

"Item inspection system, inspection method, and information processing apparatus" was invented by Mitsuhide Murofushi (Shizuoka, Japan), Tomoya Uehara (Shizuoka, Japan), Kenichi Nakao (Shizuoka, Japan), Yuki Nakajima (Kanagawa, Japan) and Kenichi Fujii (Shizuoka, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An item inspection system includes a portable system that reads information from a wireless device, a position estimation unit that estimates a position of the portable system based on reading of identification information from a first wireless device installed at a known position,...