US Patent Issued to Canon on Dec. 23 for "Inspection apparatus and control method of inspection apparatus for detecting an image defect based on image data" (Japanese Inventor)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,934, issued on Dec. 23, was assigned to Canon K.K. (Tokyo).

"Inspection apparatus and control method of inspection apparatus for detecting an image defect based on image data" was invented by Daisuke Shibata (Ibaraki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "On the basis of determination by image inspection that an image defect is generated and a predetermined condition being satisfied, an instruction unit for issuing an image diagnosis instruction is displayed on a screen of an inspection result, and image diagnosis is executed in response to an operation on the instruction unit."

The patent was filed on March 5, 2024, under Applicatio...