ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,380,552, issued on Aug. 5, was assigned to CANON K.K. (Tokyo).
"Apparatus for inspecting defect of printed material, method, and storage medium" was invented by Tsubasa Ochiai (Chiba, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "To make it possible to set an appropriate threshold value for detecting a print defect by taking into consideration an impurity included in a sheet. A lower limit value of a threshold value used for detection of a print defect is found and stored in advance. Then, whether or not a threshold value for detecting a print defect, which is set based on user instructions, is an appropriate threshold value is determined by using...