US Patent Issued to BRUKER SWITZERLAND on March 25 for "Ion analysis apparatus and method" (Swiss Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,261,034, issued on March 25, was assigned to BRUKER SWITZERLAND AG (Faellanden, Switzerland).

"Ion analysis apparatus and method" was invented by Dimitris Papanastasiou (Faellanden, Switzerland), Oliver Raether (Faellanden, Switzerland) and Niels Goedecke (Faellanden, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "An ion analysis apparatus includes an ionization source that generates a beam of ions and a trapping device that axially transfers the ions downstream. A first quadrupole mass filter receives the ions from the trapping device and transfers at least a first subset of the received ions. A segmented linear quadrupole ion trap perform...