US Patent Issued to Bruker Nano on May 20 for "Methods and systems for defects detection and classification using X-rays" (California Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,668, issued on May 20, was assigned to Bruker Nano Inc (Santa Barbara, Calif.).

"Methods and systems for defects detection and classification using X-rays" was invented by David Lewis Adler (San Jose, Calif.) and Freddie Erich Babian (Palo Alto, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In one embodiment, an automated high-speed X-ray inspection system may identify reference objects for an object of interest to be inspected. Each reference object may have a same type and components as the object of interest. The system may generate a reference model for the object of interest based on X-ray images of the reference objects. The system may...