US Patent Issued to BRUKER NANO on May 20 for "Imaging spectropolarimeter and sample characterization methodology utilizing the same" (California Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,092, issued on May 20, was assigned to BRUKER NANO INC. (Goleta, Calif.).

"Imaging spectropolarimeter and sample characterization methodology utilizing the same" was invented by Mazen Zawaideh (Carlsbad, Calif.), Chris Claypool (Carlsbad, Calif.) and Emad Zawaideh (Carlsbad, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An imaging spectropolarimeter configured to examine targets with polarized light, in which orientation of light-polarizing components is judiciously chosen to be target-specific and which employ a three-camera optical detection system defining an optical detection axis with respect to which individual camera analyzers are ori...