US Patent Issued to Bruker AXS on Sept. 9 for "System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers" (German Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,098, issued on Sept. 9, was assigned to Bruker AXS SE (Karlsruhe, Germany).

"System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers" was invented by Dominique Porta (Karlsruhe, Germany) and Fabian Nitsche (Worth am Rhein, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "System, method and computer program product for determining mass fractions of one or more elements in a test sample based on a measurement with a wave-length dispersive x-ray fluorescence (WDX) spectrometer measuring gross intensities associated with respective elements with to-be-determined mass fractions...