ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,228,998, issued on Feb. 18, was assigned to BLANCCO TECHNOLOGY GROUP IP OY (Joensuu, Finland).

"Diagnostic test prioritization based on accumulated diagnostic reports" was invented by Mikko Fabritius (Joensuu, Finland).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to an aspect, there is provided a method for guiding a user in diagnostic test selection. Initially, one or more diagnostic reports on each of a plurality of computing devices are maintained in a diagnostic report database. In response to receiving a first set of one or more device parameters characterizing a second computing device from a first computing device, a remote computing s...