US Patent Issued to Bioaxial on May 6 for "Superresolution metrology methods based on singular distributions and deep learning" (French Inventor)

ALEXANDRIA, Va., June 10 -- United States Patent no. 12,293,594, issued on May 6, was assigned to Bioaxial SAS (Paris).

"Superresolution metrology methods based on singular distributions and deep learning" was invented by Gabriel Y Sirat (Paris).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods for determining a value of an intrinsic geometrical parameter of a geometrical feature characterizing a physical object, and for classifying a scene into at least one geometrical shape, each geometrical shape modeling a luminous object. A singular light distribution characterized by a first wavelength and a position of singularity is projected onto the physical object. Light excited by the singular light distribut...