US Patent Issued to Beijing University of Technology on July 22 for "Device and method for measuring correlation between fatigue performance and microstructure of one-dimensional (1D) nanomaterial in situ in transmission electron microscope (TEM)" (Chinese Inventors)

ALEXANDRIA, Va., July 23 -- United States Patent no. 12,366,540, issued on July 22, was assigned to Beijing University of Technology (Beijing).

"Device and method for measuring correlation between fatigue performance and microstructure of one-dimensional (1D) nanomaterial in situ in transmission electron microscope (TEM)" was invented by Lihua Wang (Beijing), Yan Ma (Beijing) and Xiaodong Han (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a device and method for measuring a correlation between fatigue performance and a microstructure of a one-dimensional (1D) nanomaterial in situ in a transmission electron microscope (TEM), belongs to the technical field of in-situ te...