US Patent Issued to BEIJING INSTITUTE OF NANOENERGY AND NANOSYSTEMS on Sept. 16 for "Method and apparatus for measuring electrical properties of sample material, device and medium" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,416,657, issued on Sept. 16, was assigned to BEIJING INSTITUTE OF NANOENERGY AND NANOSYSTEMS (Beijing).

"Method and apparatus for measuring electrical properties of sample material, device and medium" was invented by Zhonglin Wang (Beijing) and Shiquan Lin (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and an apparatus for measuring an electrical property of a sample material are provided. In the method, an alternating voltage is applied to a piezoelectric ceramic so that a probe fixed on the piezoelectric ceramic vibrates above a surface of the sample material, a target contact potential difference between the probe and the sample ma...