ALEXANDRIA, Va., July 3 -- United States Patent no. 12,349,477, issued on July 1, was assigned to Beijing BOE Technology Development Co. Ltd. (Beijing) and BOE Technology Group Co. Ltd. (Beijing).

"X-ray detector and method for forming the same" was invented by Fanli Meng (Beijing), Zeyuan Li (Beijing), Jiangbo Chen (Beijing) and Ding Ding (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to an X-RAY detector including a base substrate and a plurality of detection units arranged on the base substrate. Each detection unit includes a light conversion element and a switching transistor, the light conversion element is configured to convert an optical signal into an electrica...