US Patent Issued to Beijing BOE Sensor Technology, BOE Technology Group on March 25 for "Sample preliminary screening chip, specimen detecting method, and screening device" (Chinese Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,257,582, issued on March 25, was assigned to Beijing BOE Sensor Technology Co. Ltd. (Beijing) and BOE Technology Group Co. Ltd. (Beijing).

"Sample preliminary screening chip, specimen detecting method, and screening device" was invented by Hui Liao (Beijing), Yingying Zhao (Beijing), Wenliang Yao (Beijing), Bolin Fan (Beijing), Nan Zhao (Beijing), Le Gu (Beijing) and Yongjia Gao (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure discloses a sample preliminary screening chip, a specimen detecting method and a screening device. A data processor may be configured to control a sample solution containing a specimen to be added in...