US Patent Issued to BEIJING AEROSPACE INSTITUTE FOR METROLOG AND MEASUREMENT TECHNOLOGY on May 20 for "Method for assessing test adequacy of neural network based on element decomposition" (Chinese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,745, issued on May 20, was assigned to BEIJING AEROSPACE INSTITUTE FOR METROLOG AND MEASUREMENT TECHNOLOGY (Beijing).

"Method for assessing test adequacy of neural network based on element decomposition" was invented by Yinxiao Miao (Beijing), Yifei Liu (Beijing), Ping Yang (Beijing), Xiujian Zhang (Beijing), Zhonghao Cheng (Beijing), Long Zhang (Beijing), Tianqi Wan (Beijing), Haoyi Chen (Beijing), Jing Sun (Beijing) and Yijia Ding (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for assessing test adequacy of deep neural networks based on element decomposition is provided. The network testing is divided into black box testing and w...