US Patent Issued to Beihang University on Oct. 28 for "Method, device and system for optical property measurement based on spatial frequency domain imaging" (Chinese Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,237, issued on Oct. 28, was assigned to Beihang University (Beijing).

"Method, device and system for optical property measurement based on spatial frequency domain imaging" was invented by Yanyu Zhao (Beijing) and Yubo Fan (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for optical property measurement based on spatial frequency domain imaging, includes: obtaining a first target sinusoidal light pattern with a specified spatial frequency by modulating first light emitted by a light source in a spatial frequency domain, the number of coded bits of the first target sinusoidal light pattern is smaller than a preset number of bits; irra...