ALEXANDRIA, Va., July 30 -- United States Patent no. 12,372,545, issued on July 29, was assigned to Beckman Coulter Inc. (Brea, Calif.).

"System and method for device specific quality control" was invented by Wido Menhardt (Los Galtos, Calif.), Thomas W. Roscoe (Prior Lake, Minn.) and Takayuki Mizutani (Edina, Minn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Quality control tests for a diagnostic instrument can be run in an efficient manner by using a subset of the potential quality control materials to perform tests for identifying failures in the diagnostic instrument's components. Such subsets could be defined in a variety of manners, and could allow component failures to be tested relatively more fre...