US Patent Issued to Battelle Memorial Institute on Oct. 28 for "Object detection and characterization using dual energy backscatter technique" (Ohio Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,250, issued on Oct. 28, was assigned to Battelle Memorial Institute (Columbus, Ohio).

"Object detection and characterization using dual energy backscatter technique" was invented by Wesley C. Pirkle (New Albany, Ohio), Richard J. Davis (Hilliard, Ohio) and John P. O'Brien (Worthington, Ohio).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure provides a dual energy backscatter system that uses low energy and high energy radiation sources for object detection, characterization, and defect detection. The dual energy backscatter system may also be used to determine the internal structure of the object. The dual energy backscatter syste...