US Patent Issued to Battelle Memorial Institute on May 13 for "Method of identifying vulnerable regions in an integrated circuit" (Ohio Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,343, issued on May 13, was assigned to Battelle Memorial Institute (Columbus, Ohio).

"Method of identifying vulnerable regions in an integrated circuit" was invented by Adam Gakuto Kimura (Lewis Center, Ohio), Jeremy Bellay (Columbus, Ohio) and Thomas Kent (Columbus, Ohio).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of designing a robust integrated circuit that is not vulnerable to optical fault injection comprises training a variational autoencoder to identify regions in a target integrated circuit that are vulnerable to optical fault injection and altering the design of the target integrated circuit by altering the design of the vulnera...