US Patent Issued to Battelle Memorial Institute on March 18 for "Systems and methods for inspection of IC devices" (Ohio Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,613, issued on March 18, was assigned to Battelle Memorial Institute (Columbus, Ohio).

"Systems and methods for inspection of IC devices" was invented by Nicholas Darby (Columbus, Ohio), Jeremiah Schley (Dublin, Ohio) and Jeremy Bellay (Columbus, Ohio).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an approach to non-destructive inspection of IC devices, one or more images of a Device Under Test (DUT) are received from one or more imaging devices. Observed features are detected in the one or more images and producing a first synthetic representation of a part design of the DUT that includes the observed features. The presence of one or more first...