ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,283, issued on Nov. 18, was assigned to BAR ILAN UNIVERSITY (Ramat Gan, Israel).
"System and method for mapping chemical elements in a sample" was invented by Sharon Shwartz (Kiryat Ono, Israel) and Yishay Klein (Amatzia, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "Measurement system and method are presented for determining spatial distribution of chemical elements in a sample. The system comprises a measurement unit and a control system. The measurement unit is adapted to produce primary radiation having spectral characteristic adapted to excite a number M of chemical elements in the sample to induce secondary radiation responses, and gen...