ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,443,501, issued on Oct. 14, was assigned to Bank of America Corp. (Charlotte, N.C.).
"System and method for analyzing operational parameters of electronic and software components associated with entity applications to detect anomalies" was invented by Maharaj Mukherjee (Poughkeepsie, N.Y.), Carl M. Benda (Kannapolis, N.C.), Suman Roy Choudhury (Berkeley Heights, N.J.), Colin Murphy (Charlotte, N.C.), Elvis Nyamwange (Little Elm, Texas), Utkarsh Raj (Charlotte, N.C.) and Vidya Srikanth (Sunnyvale, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Embodiments of the present invention provide a system for analyzing operational parameters of electronic ...