ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,324, issued on Aug. 5, was assigned to AUO Corp. (Hsinchu, Taiwan).
"Defect inspection system" was invented by Jing-Hong Zheng (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A defect inspection system including an imaging unit and an analysis unit is provided. The imaging unit is adapted to capture a plurality of monochrome images of at least one gray level image of a display panel through a plurality of filters. Filter colors of the filters differ from each other. The analysis unit is adapted to determine a type of defect of the display panel in an abnormal area according to a brightness ratio or a brightness change rate between two...