US Patent Issued to Auburn University on May 20 for "System and method for optimizing fault coverage based on optimized test point insertion determinations for logical circuits" (Alabama Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,247, issued on May 20, was assigned to Auburn University (Auburn, Ala.).

"System and method for optimizing fault coverage based on optimized test point insertion determinations for logical circuits" was invented by Spencer Millican (Auburn, Ala.), Yang Sun (Auburn, Ala.), Soham Roy (Auburn, Ala.) and Vishwani D. Agrawal (Auburn, Ala.).

According to the abstract* released by the U.S. Patent & Trademark Office: "The methods and systems are directed to automated computer analysis and machine learning. Specifically, the systems and methods for using machine learning to generate fault prediction models and applying the fault prediction models to logical circuits to optimize test point...