US Patent Issued to ATTOCUBE SYSTEMS on April 8 for "Active bimodal AFM operation for measurements of optical interaction" (German Inventors)

ALEXANDRIA, Va., April 9 -- United States Patent no. 12,270,827, issued on April 8, was assigned to ATTOCUBE SYSTEMS AG (Haar, Germany).

"Active bimodal AFM operation for measurements of optical interaction" was invented by Alexander A. Govyadinov (Haar, Germany), Florian Huth (Haar, Germany), Ivan Malovichko (Haar, Germany) and Marcus Diem (Haar, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention relates to a method for measuring the dielectric properties of a sample with a scanning probe microscope. In particular, the invention relates to highly-localized optical imaging and spectroscopy on a sample surface using an atomic force microscope (AFM) probe mechanically driven at two os...