US Patent Issued to ATECO on July 8 for "System for testing performance of device in temperature load test" (South Korean Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,810, issued on July 8, was assigned to ATECO INC. (Gunpo-si, South Korea).

"System for testing performance of device in temperature load test" was invented by Taek Seon Lee (Hwaseong-si, South Korea), Ho Nam Kim (Seongnam-si, South Korea), Sung Chul Moon (Gunpo-si, South Korea), Sang Bong Lee (Suwon-si, South Korea) and Se I Mi Choi (Anyang-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system for testing the performance of a device includes: a tester including a plurality of sockets capable of making electrical contact with a plurality of devices inserted therein, that tests the performance of the devices; a pusher including a plur...