ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,807, issued on March 18, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands).
"Height measurement method and height measurement system" was invented by Andrey Valerievich Rogachevskiy (Den Bosch, Netherlands), Bastiaan Andreas Wilhelmus Hubertus Knarren (Nederweert-Eind, Netherlands), Doru Cristian Torumba (Veldhoven, Netherlands), Arjan Gijsbertsen (Vught, Netherlands), Cristina Caresio (Eindhoven, Netherlands), Raymund Centeno (Nijmegen, Netherlands), Tabitha Wangari Kinyanjui (Heumen, Netherlands) and Jan Arie Den Boer (Strijen, Netherlands).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides a method for calc...