ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,494,341, issued on Dec. 9, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands).
"Delay time measurement method and system" was invented by Benoit Herve Gaury (Eindhoven, Netherlands) and Jasper Frans Mathijs Van Rens (Hegelsom, Netherlands).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of measuring a delay time of a propagation of a signal in a line in a circuit structure, the method comprises irradiating the line by pulses of a charged particle beam, wherein a pulse repetition frequency of the pulses of the charged particle beam is varied. The method further comprises measuring, for each of the pulse repetition frequencies, a seconda...