ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,381,062, issued on Aug. 5, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands).
"Tool for testing an electron-optical assembly" was invented by Arjen Benjamin Storm (Delft, Netherlands), Johan Frederik Cornelis Van Gurp (Berkel en Rodenrijs, Netherlands), Henri Kristian Ervasti (The Hague, Netherlands), Aaron Yang-Fay Ayal (Roosendaal, Netherlands), Stijn Wilem Herman Karel Steenbrink (The Hague, Netherlands) and Marco Jan-Jaco Wieland (Delft, Netherlands).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is an electron-optical assembly testing system for testing an electron-optical assembly, the system comprising: a source of cha...