ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,229,485, issued on Feb. 18, was assigned to Asahi Kasei Microdevices Corp. (Tokyo).
"Assist apparatus, design assist method, design assist system, and computer readable medium" was invented by Takaya Higa (Tokyo) and Taisuke Fujita (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a design assist apparatus including an inputting unit configured to input an analysis condition including substrate information of a thermal analysis target and current detection element information, and a display control unit configured to control a display unit to display, on the display unit, a thermal analysis result based on the analysis condition, i...