ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,712, issued on Feb. 10, was assigned to Asahi Kasei Microdevices Corp. (Tokyo).

"Apparatus and method for measuring concentration of gas in measurement target" was invented by Kakeru Ichimura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided an apparatus including a measuring unit including a light-emitting unit and a first sensor for measuring a first measurement value of a first physical quantity that varies in response to light emitted from the light-emitting unit passing through a measurement target; a second sensor for measuring a second measurement value of a second physical quantity having a correlation with a standard v...