US Patent Issued to Asahi Kasei Microdevices on April 15 for "Magnetic field measuring apparatus, magnetic field measuring method, and recording medium storing magnetic field measuring program" (Japanese Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,274,538, issued on April 15, was assigned to Asahi Kasei Microdevices Corp. (Tokyo).

"Magnetic field measuring apparatus, magnetic field measuring method, and recording medium storing magnetic field measuring program" was invented by Takenobu Nakamura (Tokyo), Shigeki Okatake (Tokyo), Yoshitaka Moriyasu (Tokyo) and Makoto Kataoka (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A magnetic field measuring apparatus is provided including: a magnetic sensor array configured so that a plurality of magnetic sensor cells including a plurality of magnetic sensors each having a magnetoresistive element and magnetic flux concentrators arranged on both ends o...