ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,460,921, issued on Nov. 4, was assigned to ARIS TECHNOLOGY LLC (Batavia, Ill.).
"Metrology 3D scanning system and method" was invented by Mingu Kang (Chicago), Levi Armstrong (Kerrville, Texas), Matthew M. Robinson (San Antonio), Marc Alban (San Antonio), Brad Johnson (Plainfield, Ill.) and James Clark (Baden, Pa.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A metrology three-dimensional (3D) scanning system includes a metrology 3D scanning application (app) comprising computing instructions that, when executed by one or more processors, causing the one or more processors to: record human-robot interaction (HRI) data as a human operator operates the HR...