ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,192, issued on June 17, was assigned to Arion Diagnostics Inc. (Petaluma, Calif.).
"Alpha diffractometer" was invented by Alexander P. Lazarev (Lake Forest, Calif.), Pavel I. Lazarev (Menlo Park, Calif.) and Delvin Tai Wai Yuk (Atherton, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray diffractometer system analyzes objects including biological tissue samples and physical and chemical samples. The diffractometer system includes an X-ray beam projector that projects an incident micro-beam of X-ray at an analysis target, an X-ray receiver including an X-ray detector array to detect the transmitted X-rays passed through the object and X-r...