ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,416,593, issued on Sept. 16, was assigned to Applied Research Associates Inc. (Albuquerque, N.M.).
"Systems and methods for measuring unique microelectronic electromagnetic signatures" was invented by Christian Eakins (Columbus, Ohio) and Thomas Kent (Columbus, Ohio).
According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for measuring unique microelectronic electromagnetic signatures are provided. A method includes injecting a nondestructive signal as input into a port of an object. The method may further include receiving as output from a signal path within the object a unique frequency dependent complex spectrum comprising a reflection spe...