US Patent Issued to APPLIED MATERIALS on Oct. 21 for "Method and apparatus for lamp housing crack detection" (American, Japanese, French Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,327, issued on Oct. 21, was assigned to APPLIED MATERIALS Inc. (Santa Clara, Calif.).

"Method and apparatus for lamp housing crack detection" was invented by Philip Mathew (Milpitas, Calif.), Mehran Behdjat (San Jose, Calif.), Masamori Sanaka (Yachiyo, Japan), Koji Nakanishi (Tokyo), Ryan Murdoch (Grenoble, France), Mark David Johnson (Orem, Utah), Jun Qian (Sherwood, Ore.), Yuchun Chang (Cupertino, Calif.) and George Govel (Schenectady, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and apparatus for lamp housing crack detection are provided herein. For example, a method associated with a process chamber having a lamp housing comprises...