ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,369, issued on Nov. 4, was assigned to Applied Materials Inc. (Santa Clara, Calif.).
"Method for image-based sensor trace analysis" was invented by Varoujan Chakarian (Northridge, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes grouping signal traces based on signal trace characteristics. The method includes generating an image, a first dimension of the image corresponding to the signal traces, and a second dimension of the image corresponding to time values, where a visual indicator corresponds to a signal trace characteristic of a signal trace at a time value, the signal trace corresponds to a row or column of the first dime...