US Patent Issued to Applied Materials on Nov. 18 for "Artificial intelligence-based hyperspectrally resolved detection of anomalous cells" (Indian Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,475,555, issued on Nov. 18, was assigned to Applied Materials Inc. (Santa Clara, Calif.).

"Artificial intelligence-based hyperspectrally resolved detection of anomalous cells" was invented by Tapashree Roy (Bangalore, India), Shubhayan Bhattacharya (Bangalore, India), Kiran Rangaswamy Aatre (Bangalore, India), Sumit Kumar Jha (Bangalore, India), Suraj Rengarajan (Bangalore, India) and Riya Dutta (West Bengal, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "According to certain embodiments, a system for detection of anomalous cells, comprises a hyperspectral imaging system; a memory having executable instructions stored thereon; and a processor conf...