US Patent Issued to Applied Materials on May 27 for "Anomaly detection from aggregate statistics using neural networks" (California Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,314,340, issued on May 27, was assigned to Applied Materials Inc. (Santa Clara, Calif.).

"Anomaly detection from aggregate statistics using neural networks" was invented by Jimmy Iskandar (Fremont, Calif.) and Michael D. Armacost (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Implementations disclosed describe systems and techniques to detect anomalies in a manufacturing operation. The techniques include generating, using a plurality of outlier detection models, a plurality of outlier scores. The outlier scores are representative of a degree of presence, in a plurality of sensor statistics, of an anomaly associated with the manufacturi...