ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,719, issued on March 25, was assigned to Applied Materials Inc. (Santa Clara, Calif.).

"Methods and mechanisms for preventing fluctuation in machine-learning model performance" was invented by Jui-Che Lin (Taipei, Taiwan), Chao-Hsien Lee (Taoyuan, Taiwan) and Shauh-Teh Juang (Zhubei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic device manufacturing system configured to receive, by a processor, input data reflecting a feature related to a manufacturing process of a substrate. The manufacturing system is further configured to generate a characteristic sequence defining a relationship between at least two manufacturing parameter...