US Patent Issued to Applied Materials on Feb. 18 for "Eco-efficiency monitoring and exploration platform for semiconductor manufacturing" (California, Texas Inventors)

ALEXANDRIA, Va., Feb. 19 -- United States Patent no. 12,228,905, issued on Feb. 18, was assigned to Applied Materials Inc. (Santa Clara, Calif.).

"Eco-efficiency monitoring and exploration platform for semiconductor manufacturing" was invented by Ala Moradian (San Jose, Calif.), Umesh Madhav Kelkar (Cupertino, Calif.), Elizabeth Neville (Sunnyvale, Calif.), Orlando Trejo (Santa Clara, Calif.), Sergey Meirovich (Austin, Texas), Kartik B. Shah (Saratoga, Calif.) and Shreyas Suresh Kher (Campbell, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Technologies directed to an eco-efficiency monitoring and exploration platform for semiconductor manufacturing. One method includes receiving, by a processing devi...