US Patent Issued to Applied Materials Israel on Oct. 28 for "Scanning electron microscopy-based tomography of specimens" (Israeli Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,456,600, issued on Oct. 28, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel).

"Scanning electron microscopy-based tomography of specimens" was invented by Itamar Shani (Mishmar David, Israel), Konstantin Chirko (Rehovot, Israel), Lior Yaron (Ness Ziona, Israel), Guy Eytan (Kfar-Aviv, Israel) and Guy Shwartz (Ramat Gan, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein is a system for non-destructive tomography of specimens. The system includes a scanning electron microscope (SEM) and a processor(s). The SEM is configured to obtain a sinogram of a tested specimen, parameterized by a vector {right arrow over (s)}, by pr...