US Patent Issued to Applied Materials Israel on Nov. 11 for "Machine learning based yield prediction" (Israeli Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,124, issued on Nov. 11, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel).

"Machine learning based yield prediction" was invented by Boris Levant (Rehovot, Israel), Noam Tal (Kiryat Ono, Israel), Ran Yacoby (Jerusalem), Lilach Choona (Rehovot, Israel), Shaul Pres (Tel Aviv, Israel), Jasmin Sonia Linshiz (Rishon LeZion, Israel), Shay Yogev (Kibbutz Kfar Menachem, Israel) and Assaf Ariel (Shoresh, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a system and method of examination of a semiconductor specimen. The method includes obtaining an e-beam image representative of a given layer of a given structure on the sp...