US Patent Issued to Applied Materials Israel on March 25 for "Machine learning based examination of a semiconductor specimen and training thereof" (Israeli Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,543, issued on March 25, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel).

"Machine learning based examination of a semiconductor specimen and training thereof" was invented by Tal Ben-Shlomo (Givatayim, Israel), Shalom Elkayam (Ramla, Israel), Shaul Cohen (Irus, Israel) and Tomer Peled (Ness-Ziona, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a system and method of runtime examination of a semiconductor specimen. The method includes obtaining a runtime image representative of an inspection area of the specimen, the runtime image having a relatively low signal-to-noise ratio (SNR); and processing the runtim...