ALEXANDRIA, Va., March 12 -- United States Patent no. 12,250,503, issued on March 11, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel).
"Prediction of electrical properties of a semiconductor specimen" was invented by Ofer Adan (Rehovot, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a method and a system configured to obtain metrology data Dmetrology informative of a plurality of structural parameters of a semiconductor specimen, obtain a model informative of a relationship between at least some of said structural parameters and one or more electrical properties of the specimen, use the model and Dmetrology to determine, for at least one given electrical property of t...