US Patent Issued to Applied Materials Israel on April 15 for "Identification of an array in a semiconductor specimen" (Israeli Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,277,750, issued on April 15, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel).

"Identification of an array in a semiconductor specimen" was invented by Yehuda Cohen (Moshav Timorim, Israel) and Rafael Bistritzer (Petach Tikva, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "There is provided a method and a system configured obtain an image of a semiconductor specimen including one or more arrays, each including repetitive structural elements, and one or more regions, each region at least partially surrounding a corresponding array and including features different from the repetitive structural elements, wherein the PMC is configured ...