US Patent Issued to Apple on Nov. 25 for "Systems and methods for silicon crack detection structure" (California, Texas Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,480,988, issued on Nov. 25, was assigned to Apple Inc. (Cupertino, Calif.).

"Systems and methods for silicon crack detection structure" was invented by David A. Karol (San Francisco), Date J.W. Noorlag (Fremont, Calif.), Scott D. Hector (Austin, Texas) and Vasu P. Ganti (Los Gatos, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods are provided for detecting defects caused by cracks in an integrated circuit, which may arise during or after a silicon wafer is singulated into separate integrated circuits. An integrated circuit may include crack detection circuitry including a metal circuit. The metal circuit may fracture or break du...