US Patent Issued to Apple on June 17 for "Systems and methods for variant testing at scale" (British, American Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,765, issued on June 17, was assigned to Apple Inc. (Cupertino, Calif.).

"Systems and methods for variant testing at scale" was invented by Jae Hyeon Bae (San Jose, Calif.), Kurt M. Fredericks (San Francisco), Nicholas Kistner (Cupertino, Calif.), Andrew T. Maher (London), Nihar Ranjan Hati (Santa Clara, Calif.), Mahesh Molakalapalli (Santa Clara, Calif.), Srivas Chennu (Rochester, Great Britain) and Jamie J. Martin (London).

According to the abstract* released by the U.S. Patent & Trademark Office: "This application sets forth techniques for variant testing at scale. In particular, the embodiments set forth provide systems and methods for testing, on a large-scale software applic...