US Patent Issued to Apple on July 29 for "Spectrum emission mask verification based on EIRP measurement" (California Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,375,195, issued on July 29, was assigned to Apple Inc. (Cupertino, Calif.).

"Spectrum emission mask verification based on EIRP measurement" was invented by Fucheng Wang (Cupertino, Calif.), Fahmi L Al Sabie (El Cajon, Calif.), Vikas O Jain (Newark, Calif.), In Kwang Kim (San Diego), Abhiram Rudrapatna Sridhar (San Jose, Calif.), Krishna Kalyanaraman (San Jose, Calif.), Ashwin Mohan (San Diego) and Anatoliy S Ioffe (Sunnyvale, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A testing device determines an Effective Isotropic Radiated Power (EIRP) of a wanted signal at a beam-peak direction and a maximum Total Radiated Power (TRP) of the wanted signa...