ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,839, issued on Dec. 30, was assigned to Apple Inc. (Cupertino, Calif.).
"Selective hit testing based on a relevancy criterion" was invented by Anshu K. Chimalamarri (Sunnyvale, Calif.) and Bart Trzynadlowski (Reno, Nev.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method is performed at an electronic device with one or more processors, a non-transitory memory, and a display. The method includes obtaining a scene graph that includes a plurality of nodes. Each of the plurality of nodes represents an object. The method includes identifying, within the plurality of nodes, a first subset of nodes based on each of the first subset of nodes satisfying ...